A differential mechanical profilometer for thickness measurement

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Campo DC	Valor	Idioma
dc.contributor.author	Alves, J. Maia	pt
dc.contributor.author	Brito, M. C.	pt
dc.contributor.author	Serra, J. M.	pt
dc.contributor.author	Vallêra, A. M.	pt
dc.date.accessioned	2010-07-27T08:55:11Z	-
dc.date.available	2010-07-27T08:55:11Z	-
dc.date.issued	2004	pt
dc.date.submitted	2004-01-21	pt
dc.identifier.uri	http://hdl.handle.net/10451/1172	-
dc.description.abstract	A low cost differential profilometer based on standard commercial displacement transducers is fully described. Unlike most common profilometers this device can be used to measure the thickness profile of samples having both surfaces irregular. A sensitivity of about 0.2 mm, independent of the sample thickness is achieved.	pt
dc.format	application/pdf	pt
dc.language.iso	eng	pt
dc.publisher	American Institute of Physics	pt
dc.rights	openAccess	pt
dc.source	Rev. Sci. Instrum. 75, 12 (2004), 5362-5363	pt
dc.subject	Differential profilometer	pt
dc.subject	Thickness measurement	pt
dc.title	A differential mechanical profilometer for thickness measurement	pt
dc.type	article	pt
Aparece nas colecções:	FC-DF - Artigos em Revistas Internacionais

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